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Pushing the Plasmonic Imaging Nanolithography to Nano-manufacturing

Author(s): Gao, P (Gao, Ping); Li, X (Li, Xiong); Zhao, ZY (Zhao, Zeyu); Ma, XL (Ma, Xiaoliang); Pu, MB (Pu, Mingbo); Wang, CT (Wang, Changtao); Luo, XG (Luo, Xiangang)

Source: OPTICS COMMUNICATIONS  Volume: 404  Special Issue: SI  Pages: 62-72  DOI: 10.1016/j.optcom.2017.06.059  Published: DEC 1 2017  

Abstract: Suffering from the so-called diffraction limit, the minimum resolution of conventional photolithography is limited to lambda/2 or lambda/4, where lambda is the incident wavelength. The physical mechanism of this limit lies at the fact that the evanescent waves that carry subwavelength information of the object decay exponentially in a medium, and cannot reach the image plane. Surface plasmons (SPs) are non-radiative electromagnetic waves that propagate along the interface between metal and dielectric, which exhibits unique sub-diffraction optical characteristics. In recent years, benefiting from SPs' features, researchers have proposed a variety of plasmonic lithography methods in the manner of interference, imaging and direct writing, and have demonstrated that sub-diffraction resolution could be achieved by theoretical simulations or experiments. Among the various plasmonic lithography modes, plasmonic imaging lithography seems to be of particular importance for applications due to its compatibility with conventional lithography. Recent results show that the half pitch of nanograting can be shrinked down to 22 nm and even 16 nm. This paper will give an overview of research progress, representative achievements of plasmonic imaging lithography, the remained problems and outlook of further developments. (C) 2017 Elsevier B.V. All rights reserved.

IDS Number: FJ3GG

ISSN: 0030-4018

eISSN: 1873-0310
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